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LiF enhanced nucleation of the low temperature microcrystalline silicon prepared by plasma enhanced chemical vapour deposition
Authors:Ji?í   Stuchlí  k,Shinya Honda,Ivo Drbohlav,Tomá  &scaron   Mates,Antoní  n Fejfar,Karel Hru&scaron  ka,The Ha Stuchlí  kova  Jan Ko?ka
Affiliation:Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 53 Praha 6, Czech Republic
Abstract:A 15-nm lithium fluoride (LiF) thin film evaporated on glass substrate is shown to enhance the nucleation of microcrystalline Si grown by plasma enhanced chemical vapour deposition at the amorphous/microcrystalline boundary conditions. The effect is more pronounced at low substrate temperatures, nucleation density being 10 times higher at ∼ 80 °C. The effect is ascribed to the ionic chemical nature of LiF, the low work function material used in organic electronic devices, and we propose its use for micro patterning crystalline Si regions in otherwise amorphous Si film.
Keywords:Amorphous hydrogenated silicon   Atomic force microscopy   Plasma-enhanced chemical vapour deposition   Nucleation   Raman scattering   Lithium fluoride   Thin films
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