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Enhanced ferro- and piezoelectric properties in (100)-textured Nb-doped Pb(ZrxTi1 − x)O3 films with compositions at morphotropic phase boundary
Authors:C Ruangchalermwong  Jing-Feng Li  Zhi-Xiang Zhu  S Muensit
Affiliation:a State Key Laboratory of New Ceramics and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, PR China
b Department of Physics, Faculty of Science, Prince of Songkla University, Hat-Yai, Songkhla 90112, Thailand
Abstract:To develop high-performance piezoelectric films on conventional Pt(111)/Ti/SiO2/Si(100) substrates, sol-gel-derived highly 100]-textured Nb-doped Pb(ZrxTi1 − x)O3 (PNZT) thin films with different Zr/Ti ratios ranging from 20/80 to 80/20 were prepared and characterized. The phase structure, ferroelectric and piezoelectric properties of the PZNT films were investigated as a function of Zr/Ti ratios, and it was confirmed that there was distinct phase transition of the PNZT system from tetragonal to rhombohedral when the Zr/Ti ratio varied across the morphotropic phase boundary (MPB). The Nb-doped PZT films showed enhanced remanent polarization but reduced coercive field, whose best values reached 75 μC/cm2 and 82 kV/cm, respectively at the composition close to MPB. In addition, the 100]-textured PNZT film at MPB also shows a high piezoelectric coefficient up to 161 pm/V. All these properties are superior to those for undoped PZT films.
Keywords:Lead zirconate titanate  Niobium doping  Film orientation  Ferroelectric properties  Piezoelectric properties  Auger electron spectroscopy  X-ray  Composition
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