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Subnanometric stabilization of plasmon-enhanced optical microscopy
Authors:Yano Taka-aki  Ichimura Taro  Kuwahara Shota  Verma Prabhat  Kawata Satoshi
Affiliation:Department of Applied Physics, Osaka University, Suita, Osaka 565-0871, Japan. yano@ap.eng.osaka-u.ac.jp
Abstract:We have demonstrated subnanometric stabilization of tip-enhanced optical microscopy under ambient condition. Time-dependent thermal drift of a plasmonic metallic tip was optically sensed at subnanometer scale, and was compensated in real-time. In addition, mechanically induced displacement of the tip, which usually occurs when the amount of tip-applied force varies, was also compensated in situ. The stabilization of tip-enhanced optical microscopy enables us to perform long-time and robust measurement without any degradation of optical signal, resulting in true nanometric optical imaging with high reproducibility and high precision. The technique presented is applicable for AFM-based nanoindentation with subnanometric precision.
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