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Controlling Exchange Coupling Strength in Ni x Cu1?x Thin Films
Authors:B Nagy  Y N Khaydukov  L F Kiss  S Sajti  D G Merkel  F Tanczikó  A S Vasenko  R O Tsaregorodsev  A Rühm  T Keller  L Bottyán
Affiliation:1. Wigner Research Centre for Physics, Hungarian Academy of Sciences, Budapest, Hungary
2. Max-Planck Institute for Solid State Research, Stuttgart, Germany
3. Forschungs-Neutronenquelle Heinz Maier-Leibnitz, Technische Universit?t München, Munich, Germany
4. Skobeltsyn Institute of Nuclear Physics, Moscow State University, Moscow, Russia
5. Institut Laue-Langevin, 6 rue Jules Horowitz, BP 156, 38042, Grenoble, France
6. Faculty of Physics, Moscow State University, Moscow, Russia
7. Max-Planck Institute for Intelligent Systems, Stuttgart, Germany
Abstract:The thickness (d F) and concentration (x) dependence of the Curie temperature of Ni x Cu1?x (d F) ferromagnetic alloy layers (x=0.55, 0.65, d F=4.5 nm÷12 nm]) in contact with a vanadium layer was studied. The Curie temperature of the ferromagnetic layers depends on the thickness when it is comparable with the transition layer between the F and the vanadium layers, which is attributed to the proximity coupling of the interface region with the rest of the F layer. The present study provides valuable information for fabrication of samples with controlled exchange coupling strength for studies of superconductor/ferromagnet proximity effects.
Keywords:
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