激光辐照对长滤HgCdTe光导探测器电学参数的影响 |
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引用本文: | 朱克学 张Yun 等. 激光辐照对长滤HgCdTe光导探测器电学参数的影响[J]. 红外与激光工程, 2002, 31(1): 55-59 |
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作者姓名: | 朱克学 张Yun 等 |
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作者单位: | 朱克学(中国科学院上海技术物理研究所,传感技术国家重点实验室,上海,200083);张赟(中国科学院上海技术物理研究所,传感技术国家重点实验室,上海,200083);李向阳(中国科学院上海技术物理研究所,传感技术国家重点实验室,上海,200083);龚海梅(中国科学院上海技术物理研究所,传感技术国家重点实验室,上海,200083);方家熊(中国科学院上海技术物理研究所,传感技术国家重点实验室,上海,200083) |
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基金项目: | 国家自然科学基金资助项目(19805014) |
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摘 要: | 对长波HgCdTe光导探测器进行了低于其永久损伤阈值的变功率激光辐照,测量辐照前后器件的电阻-温度特征,用电阻-温度特征研究材料参数的方法对实验结果进行拟合,结果表明辐照后HgCdTe探测器件的组分变大,并由此计算得到探测器性能突变后,器件的电子迁移率与电子浓度均有一定程度减小。认为这可能是由于激光辐照的热效应使N型HgCdTe光导器件的表面及体内均产生的一定的变化所致。
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关 键 词: | 长波HgCdTe光导探测器 激光辐照 电学参数 |
文章编号: | 1007-2276(2002)01-0055-05 |
收稿时间: | 2001-06-13 |
修稿时间: | 2001-06-13 |
Changes of the electric parameters of LWIR HgCdTe PC detector by laser irradiation |
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Abstract: | The long-wave HgCdTe PC detectors were irradiated by laser beam. The power of the laser beam was changeable and below the permanent damnification threshold of the long-wave HgCdTe PC detectors. The resistance-temperature characteristic of the devices before and after the irradiation is measured, since the resistance-temperature characteristic of the devices can be used to study the electric parameters of the material. This method is used to fit the result of the experiment. It indicates that the proportion of the element Cd become larger. It is concluded that the electronic mobility and electronic concentration of the devices would be reduced after the break of the performance of the detectors due to the irradiation of laser beam. |
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Keywords: | Long-wave HgCdTe PC detector Laser irradiation Resistance-temperature characteristic Fit |
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