Shear-wave time of flight diffraction (S-TOFD) technique |
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Authors: | G Baskaran Krishnan Balasubramaniam C Lakshmana Rao |
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Affiliation: | aDepartment of Applied Mechanics, Centre for Nondestructive Evaluation, Indian Institute of Technology Madras, Chennai, 600 036, India;bDepartment of Mechanical Engineering, Centre for Nondestructive Evaluation, Indian Institute of Technology Madras, Chennai, 600 036, India |
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Abstract: | Ultrasonic time of flight diffraction (TOFD) for sizing defects is based on the time of flight of the diffracted echo that is generated when a longitudinal wave is incident on a crack tip. This technique has the limitation during near-surface inspection due to signal superposition. Here, this limitation is overcome by using the shear wave-diffracted signal (instead of longitudinal wave) and hence called S-TOFD. Experiments were conducted on samples with defect tip closer to the surface of a flat plate sample to illustrate the utility of the S-TOFD technique. An increase in the flaw sizing accuracy, by using the shear wave-diffracted echoes from the tip and through the application of a signal processing technique (ESIT), was demonstrated. |
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Keywords: | Ultrasonic TOFD STOFD ESIT |
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