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| 高温超导薄膜器件的计算机数据采集测量系统 | |
| 引用本文： | 陈珂,漆汉宏,魏艳君,陈烈,郑东宁. 高温超导薄膜器件的计算机数据采集测量系统[J]. 计算机测量与控制, 2000, 8(3) |
| 作者姓名： | 陈珂 漆汉宏 魏艳君 陈烈 郑东宁 |
| 作者单位： | 1. 中科院物理所国家超导实验室,北京,100080 2. 中科院物理所国家超导实验室,北京,100080;燕山大学电气工程学院,河北·秦皇岛,066004 3. 燕山大学电气工程学院,河北,秦皇岛,066004 |
| 摘 要： | 用IEEE -4 88总线将电流源、纳伏表和锁相放大器等连接构成一个计算机测量分析系统 ,采用基于Win dows的Labview测量程序 ,可实现对高温超导薄膜器件进行R -T曲线、I -V曲线、X -T曲线等的测量 ,通过AD卡采集数据 ,还可实现SQUIDs器件所测电磁信号的频谱分析 ,测量结果准确可靠 ,而且可以精确标定 |
| 关 键 词： | 总线 计算机测量 曲线 标定 |
Computer Data Collecting and Measuring System for High-Tc Superconducting Thin Film Devices |
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| CHEN Ke,QI Han-hong,CHEN Lie,ZHENG Dong-ning,WEI Yan-jun. Computer Data Collecting and Measuring System for High-Tc Superconducting Thin Film Devices[J]. Computer Measurement & Control, 2000, 8(3) | |
| Authors: | CHEN Ke QI Han-hong CHEN Lie ZHENG Dong-ning WEI Yan-jun |
| Abstract: | In this paper, we constitute a computer measuring and analyzing system using IEEE 488 bus connecting current source, nanovoltmeter and lock in amplifier etc. Using Labview measuring program based on Windows, we can measure the R T, I V and X T curves etc. for the High Tc superconducting thin film devices. By collecting data from AD card, we can also realize the frequency spectra analysis of the electro magnetic signal measured by SQUIDs. The results are reliable and can be demarcated precisely. |
| Keywords: | bus computer measurement curve measurement demarcation |
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