| X射线荧光法测量金薄膜和镀层的厚度 |
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| 引用本文： | 黄近丹. X射线荧光法测量金薄膜和镀层的厚度[J]. 福建分析测试, 2000, 0(2) |
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| 作者姓名： | 黄近丹 |
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| 作者单位： | 福建省测试技术研究 福州 |
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| 摘 要： | 采用X射线荧光能谱仪,分别测量基底元素的强度,以求得金薄膜和镀层的厚度。用镀金片检验,当薄膜和镀层厚度t<3.0μm时,测量偏差<0.10μm,方法简便,可方便地用于镀层厚度的控制生产中。
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| 关 键 词： | X射线荧光法 薄膜和镀层 厚度 测定 |
Measurement of the Thickness of Gold Film and Coating by X-Ray Fluorimetry |
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| Huang Jindan. Measurement of the Thickness of Gold Film and Coating by X-Ray Fluorimetry[J]. Fujian Anal Ysis & Testing, 2000, 0(2) |
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| Authors: | Huang Jindan |
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| Affiliation: | Fujian Institute of Testing Technology. Fuzhou 350003 |
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| Abstract: | Measure the strength of base element respectivly by X-ray fluorescent spectrometer to obtain the thickness of gold membrance and cating. To test by gold plate, the measuring deviation is<0.10m, when the thickness of gold membrance and coating is t<0. 3μm. The method is simple and convenient for the controlling production of the coating thickness. |
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| Keywords: | X-ray Fluorimetry Membrance Coating Metering |
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