A Computer-Aided Scheme of Threshold Voltage Measurement for Floating-Gate Mos Transistor

In this paper, analog multiplexers, a threshold voltage measurement block, 16-bit analog-to-digital converter, and a computer are employed to achieve a new scheme of threshold voltage measurement for a floating-gate MOS transistor (FGT). Feedback technology is applied so that the threshold voltage can be measured with good accuracy. A threshold voltage measurement with a maximum error equal to 1% can be achieved. The proposed scheme does not require any matched components, and thus it can be applied effectively to threshold voltage measurement for multiple FGTs. The sampling time of the threshold voltage measurement is 3 ms. Dynamic responses and static characteristics are demonstrated with experimental results.