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Imaging the Electric‐Field Distribution in Organic Devices by Confocal Electroreflectance Microscopy |
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| Authors: | Michele Celebrano Calogero Sciascia Giulio Cerullo Margherita Zavelani‐Rossi Guglielmo Lanzani Juan Cabanillas‐Gonzalez |
| Affiliation: | 1. Dipartimento di Fisica, Politecnico di Milano Piazza Leonardo da Vinci 32, 20133 Milano (Italy);2. Current address: Laboratory of Physical Chemistry, ETH Zurich, CH‐8093 Zurich (Switzerland). |
| Abstract: | Space resolved Stark spectroscopy is introduced as a non invasive optical technique for imaging electric field distribution in organic semiconductors. Stark spectroscopy relies on the electric field induced change in the absorption/reflection. It is shown that local monitoring of Stark shift with confocal spatial resolution provides quantitative information on the strength of the local field as well as charge distribution within the transport channel. |
| Keywords: | Molecular electronics Nonlinear optics Photovoltaic devices Scanning probe microscopy Transistors |