Principles of Highly Resolved Determination of Texture and Microstructure using High‐Energy Synchrotron Radiation

Diffraction imaging with hard X‐rays (high‐energy synchrotron radiation) using the detector sweeping techniques allows measurement of the texture and microstructure of polycrystalline materials with high orientation‐ and location‐resolution. These techniques provide continuous two‐dimensional images of different sections and projections of the six‐dimensional “orientation‐location” space. For the high orientation resolution case, it is possible to measure the orientation and location coordinates of up to 10⁵ individual grains simultaneously. From these parameters, the grain size and shape can also be obtained, yielding the complete orientation stereology of the polycrystalline aggregate, which is required for its complete characterization. For the high location resolution case, the intensity at any point of the diagrams corresponds to a pole density as a function of the orientation‐location space.