Measurement of dielectric properties of high-absorption materials at microwave frequencies |
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| Authors: | É R Kasimov M A Sadykhov R M Kasimov Ch O Kadzhar |
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| Affiliation: | (1) Department of Inorganic Materials, Shanghai University, 149 Yanchang Road, Shanghai, 200072, China; |
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| Abstract: | A method is proposed for measuring the dielectric constant ε′ and dielectric loss ε″ of high-absorption dielectric materials
by measuring the reflection of electromagnetic radiation with the aid of an adjustable quarter-wave matching plate of nonabsorbing
material close to the dielectric surface.
Translated from Izmeritel'naya Tekhnika, No. 5, pp. 45–47, May, 1999. |
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