| 单片机教学系统驱动芯片测试装置的设计 |
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| 引用本文： | 高原,陈雅妮. 单片机教学系统驱动芯片测试装置的设计[J]. 电子测试, 2017, 0(20) |
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| 作者姓名： | 高原 陈雅妮 |
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| 作者单位： | 1. 曲阜师范大学实验教学中心,山东日照,276826;2. 山东信息职业技术学院,山东潍坊, 261000 |
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| 摘 要： | 针对DTHS-A单片机实验平台的日常维护需要设计了该测试装置,该装置能够快速的检测实验电路中驱动芯片是否正常,与传统方法相比,节约了维护的时间,提高了检测效率.该装置以STC15F2K61S2为控制核心,通过按键与拨码开关来选择对应芯片,通过液晶显示与LED指示芯片是否正常,同时具有过流保护功能.
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| 关 键 词： | STC15F2K61S2 芯片检测 |
Design of test device for driving chip of single-chip teaching system |
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| Gao Yuan,Chen Yani. Design of test device for driving chip of single-chip teaching system[J]. Electronic Test, 2017, 0(20) |
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| Authors: | Gao Yuan Chen Yani |
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| Abstract: | The daily maintenance of DTHS-A MCU experimental platform requires a test device design, the device can detect the experimental circuit of the rapid drive chip is normal, compared with traditional methods, saving the maintenance time, improve the detection efficiency. The device uses STC15F2K61S2 as the control core, selects the corresponding chip through the button and the dial switch, through the LCD display and the LED indicating whether the chip is normaland has the over-current protection function. |
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| Keywords: | STC15F2K61S2 Chip inspection |
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