| GaAs红外发光二极管加速寿命试验研究 |
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| 引用本文： | 万金平.GaAs红外发光二极管加速寿命试验研究[J].电子测试,2017(18). |
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| 作者姓名： | 万金平 |
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| 作者单位： | 南昌欣磊光电科技有限公司,江西南昌,330012 |
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| 摘 要： | 本文采用步进应力的试验方法设计了一个针对GaAs红外发光二极管的可靠性加速寿命的研究方案.这种方法主要是把步进应力和恒定应力两种方法相结合,用此来评估GaAs红外发光二极管的可靠度;然后总结除了GaAs红外发光二极管这种光电器件的寿命分布形式和失效模式.
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| 关 键 词： | GaAs红外发光二极管 可靠性 应力试验 寿命 |
Accelerated life test of GaAs infrared light emitting diode |
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| Wan Jinping.Accelerated life test of GaAs infrared light emitting diode[J].Electronic Test,2017(18). |
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| Authors: | Wan Jinping |
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| Abstract: | In this paper, a method of reliability accelerated life of GaAs infrared LED is designed by step stress test method. This method is mainly to step stress and constant stress the combination of the two methods, the reliability evaluation of GaAs infrared light emitting diode; then in addition to life distribution form and failure mode of GaAs infrared light emitting diode of the photoelectric device. |
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| Keywords: | GaAs infrared light emitting diode reliability stress test life |
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