SOC基于LFSR的混合模式测试

随着集成电路深亚微米制造技术和设计技术迅速发展,系统芯片(SOC)作为一种解决方案得到了越来越广泛的应用。SOC的测试中,内建自测试(Built.In Self-Test,BIST)成为人们研究的热点。文中对SOC的设计特点及其BIST中的混合模式测试进行了探讨。

LFSR-based SOC Mixed-mode Test

With the rapid development of technology of the deep sub-micron integrated circuit manufacturing technology and design,system-on-chip (SOC) as a solution has been increasingly widely used.Built-in self-test (Built.In Self-Test,BIST) in SOC test has become a hot research.In this paper,the SOC design characteristics and mixed-mode testing of the BIST were discussed.