PCB AOI检测中微小缺陷成像分析与检测

自动光学检测（AOI）已成为PCB检测的主要方式，线路板微小缺陷检测对于AOI系统是严峻的挑战。研究线路板微小缺陷的成像问题。运用成像理论，研究了欠采样条件下微小缺陷的成像特点，分析了缺陷尺寸与像素分辨率的比例及采样相位对成像的影响，并进行了实验验证。该研究对PCB AOI系统的设计和检测性能分析有重要意义。

Inspection of small size defect in PCB AOI

Automatic Optical Inspection technology has been widely applied to control the quality of PCB. It＇s a serious problem to inspect small size defect by PCB AOI system. In this paper, we analyze the pattern of under-sampling imaging in PCB AOI. The relationship of three factors, defect＇s size, pixel resolution and sampling phase, are studied. The experiment result is presented. It＇s important to the design ofPCB AOI.