| ICP-MS测定床内触体中铅的含量 |
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| 引用本文： | 胡鹏飞,胡家啟.ICP-MS测定床内触体中铅的含量[J].广东化工,2012,39(13):130-132. |
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| 作者姓名： | 胡鹏飞 胡家啟 |
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| 作者单位： | 浙江开化合成材料有限公司,浙江衢州,324004 |
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| 摘 要： | 文章采用电感耦合等离子体质谱仪(ICP-MS)测定了甲基氯硅烷生产使用的有机硅床内触体中的铅(Pb)含量,研究了触体中存在的主要元素铜(Cu)对Pb的基体干扰。探讨了采取不同试样预处理方法对测定结果的影响。经测试对比,先加王水热熔,后用硫酸洗脱的方式结果较为准确,测得有机硅合成床内触体中Pb含量1.516 ppm,且RSD值仅为1.03%。
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| 关 键 词： | ICP-MS 有机硅 触体 铅 测定 |
Lead Content from Silicon Contact Mass Determined by ICP-MS |
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| Hu Pengfei,Hu Jia.Lead Content from Silicon Contact Mass Determined by ICP-MS[J].Guangdong Chemical Industry,2012,39(13):130-132. |
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| Authors: | Hu Pengfei Hu Jia |
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| Affiliation: | qi(Zhejiang Kaihua Synthetic material Ltd.,Quzhou 324004,China) |
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| Abstract: | The Lead content in the production of methyl chorosilanes contact mass was determined by ICP-MS,and the impact of the elements interfering elements copper was studied.Considered the effection of different sample preparation methods on the Measured results.after contradistinction,Taking the methode of whicht,first using Aqua Regia heated and dissolved the solid,then using concentrated sulfuric acid eluted could receive an exceptional result,Lead Content from Silicon Contact Mass Determined towards 1.156ppm,with RSD only 1.03 %. |
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| Keywords: | ICP-MS silicone contact mass lead determination |
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