Microstructural investigation of Bi–Sr–Ca–Cu–oxide thick films on alumina substrates

The microstructure of Bi–Sr–Ca–Cu–oxide (BSCCO) thick films on alumina substrates has been characterized using a combination of X-ray diffractometry, scanning electron microscopy, transmission electron microscopy of sections across the film/substrate interface and energy-dispersive X-ray spectrometry. A reaction layer formed between the BSCCO films and the alumina substrates. This chemical interaction is largely responsible for off-stoichiometry of the films and is more significant after partial melting of the films. A new phase with f c c structure, lattice parameter a = 2.45 nm and approximate composition Al₃Sr₂CaBi₂CuO _x has been identified as reaction product between BSCCO and Al₂O₃. This revised version was published online in November 2006 with corrections to the Cover Date.