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CMOS图像传感器中RSD A/D转换器的设计与实现
引用本文:刘丰,姚素英,史再峰.CMOS图像传感器中RSD A/D转换器的设计与实现[J].光电子.激光,2008,19(10).
作者姓名:刘丰  姚素英  史再峰
作者单位:天津大学电子信息工程学院ASIC设计中心,天津,300072
摘    要:提出了CMOS图像传感器中RSD A/D转换器的设计方法.基于冗余符号数(RSD)算法,RSD A/D转换器降低了对比较器的性能要求.并且全差分的模拟信号处理用以改进抗噪声度,信噪比和系统的动态范围.RSD A/D转换器是基于90 nm CMOS工艺实现的,测试结果表明它的微分非线性误差(DNL)为±1 LSB,积分非线性误差(INL)为±1.5 LSB,总的未调整误差(TUE)为-3 LSB~1 LSB,功耗约为20 mW.

关 键 词:CMOS图像传感器  A/D转换器  微分非线性  积分非线性  总的未调整误差

Design and realization of RSD A/D converter in CMOS image sensors
LIU feng,YAO Su-ying,SHI Zai-feng.Design and realization of RSD A/D converter in CMOS image sensors[J].Journal of Optoelectronics·laser,2008,19(10).
Authors:LIU feng  YAO Su-ying  SHI Zai-feng
Affiliation:LIU feng,YAO Su-ying,SHI Zai-feng (ASIC Design Center,School of Electronic & Information Engineering,Tianjin University Tianjin 300072,China)
Abstract:A cyclic redundant singed digit(RSD) analog to digital converter(ADC) in CMOS image sensor is presented.Based on RSD principle,RSD A/D converter reduces the requirements of comparators.Fully differential analog signal handling greatly improves noise rejection,signal-noise-ratio(SNR) and dynamic range of the system.This ADC is fabricated in the standard 90 nm CMOS technology and achieres some good characteristics such as low power high resolution,high speed and small silicon area.The measured DNL is less tha...
Keywords:RSD
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