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Interaction of swift ion beams with surfaces: Sputtering of secondary ions from LiF studied by XY-TOF-SIMS
Authors:H HijaziH Rothard  P BoduchI Alzaher  F RoparsA Cassimi  JM RamillonT Been  B Ban d’EtatH Lebius  LS FarenzenaEF da Silveira
Affiliation:a Centre de Recherche sur les Ions, les Matériaux et la Photonique CIMAP (CEA-CNRS UMR 6252- ENSICAEN-Université de Caen-Basse Normandie), CIMAP-CIRIL-Ganil, BP 5133, Boulevard Henri Becquerel, F-14070 Caen Cedex 05, France
b Physics Department, Universidade Federal de Santa Catarina, Florianópolis, SC, Brazil
c Pontifícia Universidade Católica PUC, Departamento de Física, Rua Marques de São Vicente 225, Gávea, 22453-900 Rio de Janeiro, Brazil
Abstract:
Keywords:Sputtering  Highly charged ions  Lithium fluoride
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