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Interaction of swift ion beams with surfaces: Sputtering of secondary ions from LiF studied by XY-TOF-SIMS |
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| Authors: | H. HijaziH. Rothard,P. BoduchI. Alzaher,F. RoparsA. Cassimi,J.M. RamillonT. Been,B. Ban d&rsquo EtatH. Lebius,L.S. FarenzenaE.F. da Silveira |
| Affiliation: | a Centre de Recherche sur les Ions, les Matériaux et la Photonique CIMAP (CEA-CNRS UMR 6252- ENSICAEN-Université de Caen-Basse Normandie), CIMAP-CIRIL-Ganil, BP 5133, Boulevard Henri Becquerel, F-14070 Caen Cedex 05, France b Physics Department, Universidade Federal de Santa Catarina, Florianópolis, SC, Brazil c Pontifícia Universidade Católica PUC, Departamento de Física, Rua Marques de São Vicente 225, Gávea, 22453-900 Rio de Janeiro, Brazil |
| Abstract: | |
| Keywords: | Sputtering Highly charged ions Lithium fluoride |
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