Forensic analysis of tempered sheet glass by particle induced X-ray emission (PIXE) |
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Authors: | LJ JisonnaPA DeYoung J FerensC Hall JM LunderbergP Mears D PadillaGF Peaslee R Sampson |
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Affiliation: | a Department of Chemistry and Department of Physics, Hope College, Holland, MI 49422-9000, United States b Department of Physics, San Diego State University, San Diego, CA 92182-1233, United States c Department of Physics, Columbia University, New York, NY 10027, United States |
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Abstract: | The elemental concentrations of five trace elements in tempered sheet glass fragments were determined using particle-induced X-ray emission (PIXE) spectrometry. The trace element concentrations for calcium, iron, manganese, strontium, and titanium are compared to those obtained by inductively-coupled plasma-atomic emission spectrometry (ICP-AES) following complete digestion by hydrofluoric acid. For these five elements, the absolute concentrations obtained by both methods are shown to agree well over a wide range of concentrations. The limits of detection for trace elements are typically lower for the ICP-AES method. However, we show that the concentrations of these five elements can be accurately measured by the PIXE method. Since PIXE is an entirely non-destructive method, there exists a niche for this technique to be used as a complement to the more sensitive ICP-AES technique in the forensic analysis of sheet glass. |
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Keywords: | Ion beam analysis PIXE Glass ICP-AES Nondestructive Forensic trace element analysis |
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