YBCO Bicrystal Junctions on Sapphire: d-Wave Impact and Possible Applications |
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Authors: | Gennady A. Ovsyannikov Alexander D. Mashtakov Igor V. Borisenko Karen Y. Constantinian |
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Affiliation: | (1) Institute of Radio Engineering and Electronics RAS, Moscow, 103907, Russia |
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Abstract: | The current transport and Josephson effect have been investigated in YBCO junctions, fabricated on the sapphire bicrystal substrates. The YBCO film with thickness t 150 nm was deposited by dc sputtering on the epitaxial CeO2buffer layer made by rf magnetron sputtering. The junctions were characterized at dc and at mm waves. 5 m wide junctions have moderately high normal state resistance RN= 5÷30 with critical currents Ic=50÷200 A which give IcRNproduct of order of 0.5÷2 mV. The tolerance of characteristic interface resistance (RNS) was around 30% for the junctions on a chip. Experimental data, discussed in terms of d-wave symmetry, demonstrate possibility of design of small scale integrated Josephson microwave circuits. |
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