| 含FPGA电路板的测试诊断方法研究 |
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| 引用本文： | 孙少军,蔡士闽.含FPGA电路板的测试诊断方法研究[J].国外电子测量技术,2011,30(11):44-47. |
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| 作者姓名： | 孙少军 蔡士闽 |
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| 作者单位： | 1. 解放军91404部队,秦皇岛,066001
2. 海军航空工程学院控制工程系,烟台,264001 |
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| 摘 要： | 随着微电子技术的不断发展,越来越多的FPGA等复杂逻辑器件应用到武器装备电路板上,使电路板结构功能日趋复杂,导致传统的方法已不能对该类电路板进行有效的测试.为此,文章首先通过对FPGA的结构分析来说明FPGA测试的特殊性与复杂性,然后针对各种测试方法的优缺点,提出一种LASAR软件与ATE测试平台相结合的方法.
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| 关 键 词： | 测试 FPGA LASAR ATE |
Study on test method of FPGA circuit board |
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| Sun Shaojun,Cai Shichuang.Study on test method of FPGA circuit board[J].Foreign Electronic Measurement Technology,2011,30(11):44-47. |
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| Authors: | Sun Shaojun Cai Shichuang |
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| Affiliation: | 1.No.91404 Troops of PLA,Qinhuangdao 066001,China;2.Naral Aeronautical and Astronautical University,Yantai 264001,China) |
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| Abstract: | With the continuous development of microelectronic technology,more and more complex logic devices are applied to the circuit board of weapons equipment.It makes the growing complexity of the circuit board structure and function and the traditional method can not be effective for that type of circuit board test.Therefore,first of all,the article discourse the specificity and complexity of the FPGA testing by analyzing the structure of the FPGA.Then,for the advantages and disadvantages of various testing methods,we present a method based on LASAR software and ATE test platform. |
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| Keywords: | testing FPGA LASAR ATE |
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