| 一种基于扫描结构的混合模式BIST的低功耗设计 |
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| 引用本文： | 陈卫兵. 一种基于扫描结构的混合模式BIST的低功耗设计[J]. 电子质量, 2007, 0(12): 1-2,8 |
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| 作者姓名： | 陈卫兵 |
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| 作者单位： | 阜阳师范学院物理系,阜阳,236041 |
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| 摘 要： | 针对扫描结构混合模式BIST的特点,文章提出了一种利用双模式LFSR和新型折叠控制器相结合的方法来对基于扫描结构的混合模式BIST电路进行低功耗优化设计,从而达到降低待测电路功耗的目的.
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| 关 键 词： | BIST 折叠集 折叠控制器 双模式LFSR 准单输入跳变 |
| 文章编号： | 1003-0107（2007）12-O001-03 |
A Low Power Design of Mixed-mode BIST Based on Scanning Structure |
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| Chen Wei-bing. A Low Power Design of Mixed-mode BIST Based on Scanning Structure[J]. Electronics Quality, 2007, 0(12): 1-2,8 |
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| Authors: | Chen Wei-bing |
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| Abstract: | This paper gives a new design of mixed-mode BIST based on scanning structure that can highly reduce the power consumption of circuit under testing. This design makes opitimization on odginal mixedmode BIST based on scanning structure by combining two-mode LFSR with new folding controller. |
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| Keywords: | BIST |
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