首页 | 本学科首页   官方微博 | 高级检索  
     


The charge carrier density modulation in off-stoichiometric ZrNiSn leads to enhanced thermoelectric performance
Affiliation:1. CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi, 110012, India;2. Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, 201002, India;3. Functional Materials and Microsystems Research Group and the Micro Nano Research Facility, RMIT University, Melbourne, VIC, 3001, Australia;4. School of Engineering, RMIT University, GPO Box 2476, Melbourne, Victoria, 3001, Australia;5. Applied Physics Department, Faculty of Engineering and Technology, M. J. P. Rohilkhand University, Bareilly, 243006, India;1. School of Mechanical Engineering, Shandong University of Technology, Zibo, 255000, China;2. School of Materials Science and Engineering, Shandong University of Technology, Zibo, 255000, China;3. Institute of Additive Manufacturing, Shandong University of Technology, Zibo, 255000, China;4. Shandong Industrial Ceramics Research & Design Institute Co., Ltd., Zibo, 255000, China;5. School of Chemistry and Chemical Engineering, Shandong University of Technology, Zibo, 255000, China;1. Faculty of Chemistry, Southern Federal University, Rostov-on-Don, Russia;2. Southern Scientific Center of Russian Academy of Science, Rostov-on-Don, Russia;1. State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, China;2. School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China;3. BGRIMM Magnetic Materials & Technology Co, Ltd, Beijing, 102600, China;1. Graduate Program in Aerospace Engineering, Universidade Federal de Pernambuco, Av. Prof. Moraes Rego, 1235 - Cidade Universitária, 50670-901, Recife, Brazil;2. Department of Mechanical Engineering, Universidade Federal de Pernambuco, Av. Prof. Moraes Rego, 1235 - Cidade Universitária, 50740-550, Recife, Brazil;3. Graduate Program in Materials Science, Universidade Federal de Pernambuco, Av. Prof. Moraes Rego, 1235 - Cidade Universitária, 50740-560, Recife, Brazil;4. Graduate Program in Chemistry, Universidade Federal de Pernambuco, Av. Prof. Moraes Rego, 1235 - Cidade Universitária, 50740-560, Recife, Brazil;5. Department of Fundamental Chemistry, Universidade Federal de Pernambuco, Av. Jorn. Aníbal Fernandes, 1235 - Cidade Universitária, 50740-560, Recife, Brazil
Abstract:
Keywords:Thermoelectric  Half-heusler  Carrier density modulation  Figure-of-merit  Microhardness
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号