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A Study of the Radiation Hardness of Si and SiC Detectors Using a Xe Ion Beam |
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| Authors: | L. Hrubčín Yu. B. Gurov B. Zaťko O. M. Ivanov S. V. Mitrofanov S. V. Rozov V. G. Sandukovsky V. A. Semin V. A. Skuratov |
| Affiliation: | 1.Joint Institute for Nuclear Research,Dubna,Russia;2.Institute of Electrical Engineering, Slovak Academy of Sciences,Bratislava,Slovakia;3.National Research Nuclear University, Moscow Engineering Physics Institute,Moscow,Russia |
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