High performance of high-voltage 4H-SiC Schottky barrier diodes |
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Authors: | Itoh A Kimoto T Matsunami H |
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Affiliation: | Dept. of Electr. Eng., Kyoto Univ.; |
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Abstract: | High performance of high-voltage rectifiers could be realized utilizing 4H-SiC Schottky barrier diodes. A typical specific on-resistance (Ron) of these devices was 1.4×103 Ω cm3 at 24°C (room temperature) with breakdown voltages as high as 800 V. These devices based on 4H-SiC had R on's lower than 6H-SiC based high-power rectifiers with the same breakdown voltage. As for Schottky contact metals, Au, Ni, and Ti were employed in this study. The barrier heights of these metals for 4H-SiC were determined by the analysis of current-voltage characteristics, and the reduction of power loss could be achieved by controlling the barrier heights |
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