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高精度测量F-P标准具间距的光谱方法
引用本文:黄文财,谢建平,吕亮,陈曦曜,明海,鲁拥华,王安廷. 高精度测量F-P标准具间距的光谱方法[J]. 中国激光, 2003, 30(8): 739-742
作者姓名:黄文财  谢建平  吕亮  陈曦曜  明海  鲁拥华  王安廷
作者单位:中国科学技术大学物理系,安徽,合肥,230026
基金项目:安徽省自然科学基金 (编号BJ0 2 0 8)资助项目
摘    要:利用高分辨率光谱分析仪对空气隙F P标准具透射谐振峰频率进行测量 ,然后通过直线拟合获得自由谱域 ,从而计算得出F P标准具的间距。对F P标准具间距测量的精度进行分析 ,F P标准具间距测量的相对误差为2× 10 -3 。提出了一种新颖的入射光与F P标准具垂直的精确调节方法

关 键 词:光学技术与仪器  F-P标准具  高分辨率光谱分析仪  多光束干涉
收稿时间:2002-04-27

Spectrum Method of F-P Etalon Spacing High Precision Measurement
Abstract:In this paper, a method was reported that used a high precision optical spectrum analyzer to measure transmission resonant frequency of air gap F-P etalon and got its free spectrum range by linear fitting. The spacing of F-P etalon was calculated based on this. The measuring precision of this method was analyzed, which showed that the relative error of F P etalon spacing measurement was 2×10 -3 . A novel method of F-P etalon perpendicularity adjusting was introduced as well.
Keywords:optical technique and instrument  F P etalon  high precision optical spectrum analyzer  multi beam interference
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