首页 | 本学科首页   官方微博 | 高级检索  
     


Weaving temporal and reliability aspects into a schema tapestry
Affiliation:1. Aalborg University, Aalborg, Denmark;2. Universitat Politélcnica de Catalunya, BarcelonaTech, Barcelona, Spain;1. Programa de Pós-graduação em Ciências Farmacêuticas da Universidade Federal do Rio Grande do Sul, Porto Alegre, RS 90610-000, Brazil;2. Departamento de Bioquímica da Universidade Federal do Rio Grande do Sul, Porto Alegre, RS 90035-003, Brazil;1. Institute of Artificial Intelligence, Beihang University, Beijing 100191, China;2. Beijing System Design Institute of Electro-Mechanic Engineering, Beijing 100854, China;3. School of Mathematical Sciences, Beihang University, Beijing 100191, China;4. Key Laboratory of Mathematics, Informatics and Behavioral Semantics, Ministry of Education, 100191, China;5. Peng Cheng Laboratory, Shenzhen, Guangdong 518066, China
Abstract:In aspect-oriented programming (AOP) a cross-cutting concern is implemented in an aspect. An aspect weaver blends code from the aspect into a program’s code at programmer-specified cut points, yielding an aspect-enhanced program. In this paper, we apply some of the concepts from the AOP paradigm to data. Like code, data also has cross-cutting concerns such as versioning, security, privacy, and reliability. We propose modeling a cross-cutting data concern as a schema aspect. A schema aspect describes the structure of the metadata in the cross-cutting concern, identifies the types of data elements that can be wrapped with metadata, i.e., the cut points, and provides some simple constraints on the use of the metadata. Several schema aspects can be applied to a single data collection, though in this paper we focus on just two aspects: a reliability aspect and a temporal aspect. We show how to weave the schema for these two aspects together with the schema for the data into a single, unified schema that we call a schema tapestry. The tapestry guides the construction, interpretation, and validation of an aspect-enhanced data collection.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号