| 电子产品静电放电的危害、测试及其对策(一) |
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| 引用本文： | 朱文立.电子产品静电放电的危害、测试及其对策(一)[J].电子质量,2003(3):55-58. |
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| 作者姓名： | 朱文立 |
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| 作者单位： | 中国赛宝实验室安全与电磁兼容检测中心 |
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| 摘 要： | 随着电子产品自动化、智能化程度越来越高，静电放电对其危害也越来越严重，本文根据笔者实际工作经验及相关资料就静电放电形成机理、对电子产品的危害及静电放电敏感度测试、电路设计对策等提出一些观点和看法，供大家在实际使用中参考。
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| 关 键 词： | 电子产品 静电放电 敏感度测试 电路设计 电磁干扰 产生原因 半导体器件 辐射干扰 ESD |
The Harm Of The Static Discharge Of Electronic Products, Testing Methods And Countermeasures |
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| ZHU Wen-Li The Safety and Electromagnetic Compatibility Testing Center of the China Saibao Lab.The Harm Of The Static Discharge Of Electronic Products, Testing Methods And Countermeasures[J].Electronics Quality,2003(3):55-58. |
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| Authors: | ZHU Wen-Li The Safety and Electromagnetic Compatibility Testing Center of the China Saibao Lab |
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| Affiliation: | ZHU Wen-Li The Safety and Electromagnetic Compatibility Testing Center of the China Saibao Lab |
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| Abstract: | More automatized and intelligent the electronic products become, more harm the static discharge will do to them. Based upon the practical experience of the author andrelated files, this paper analyses how the static discharge comes into being and its harm to the electronic products, and then puts forward the sensitivity test and thecircuit design for the reference of everybody in practice. |
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| Keywords: | Electronic products static discharge test and design |
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