| 电子设备测试性关键技术概述与研究 |
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| 引用本文： | 宋振宇,丁勇鹏,卢琳.电子设备测试性关键技术概述与研究[J].仪器仪表用户,2010,17(6):5-7. |
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| 作者姓名： | 宋振宇 丁勇鹏 卢琳 |
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| 作者单位： | 海军航空工程学院; |
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| 摘 要： | 测试性是设计人员赋予产品的固有属性,对高技术含量和高复杂性电子设备的故障检测和隔离起着至关重要的作用。从电子设备的测试性分析、设计和验证三个方面入手,探讨了基于多信号流图模型的测试性分析技术、以内建自测试(BIST)为代表的数字电路测试性设计技术以及测试性试验验证法和仿真验证法,最后展望了未来测试性技术的发展方向。
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| 关 键 词： | 测试性 多信号流图 内建自测试 试验验证 仿真验证 |
The study about the key testing technology of electronic equipment |
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| SONG Zhen-yu,DING Yong-peng,LU Lin.The study about the key testing technology of electronic equipment[J].Electronic Instrumentation Customer,2010,17(6):5-7. |
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| Authors: | SONG Zhen-yu DING Yong-peng LU Lin |
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| Affiliation: | SONG Zhen-yu,DING Yong-peng,LU Lin(Naval Aeronautical and Astronautical University,Yantai 264001,Chna) |
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| Abstract: | Testability is designed to be the inherent property of product.It plays a vital role in the fault detection and isolation of the electronic equipment that own high-tech and high complexity.In this paper,author start from testing analysis,design and verification,then,study the testing analysis based on multi-signal flow graph,the DFT that is representative by BIST,and testing verification by trial and simulation.Finally,the future development of test technologies has been expected. |
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| Keywords: | testability multi-signal flow graph BIST verification by trial verification by simulation |
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