| 微机低励失磁保护阻抗特性曲线的两种测试方法 |
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| 引用本文： | 陈新美,李亚萍,赵丽萍.微机低励失磁保护阻抗特性曲线的两种测试方法[J].电力系统保护与控制,2001,29(6):43-44,48. |
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| 作者姓名： | 陈新美 李亚萍 赵丽萍 |
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| 作者单位： | 国家继电器质量监督检验中心，河南 许昌 461000 |
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| 摘 要： | 介绍了微机低励失磁保护的基本原理 ,提出了两种测试低励失磁保护阻抗特性曲线的试验方法 ,并通过试验验证 ,证明了这两种方法的可操作性。
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| 关 键 词： | 低励失磁保护 静稳阻抗 稳态异步阻抗 |
| 文章编号： | 1003-4897(2001)06-0043-02 |
Two testing ways to test the impedance characteristics of microprocessor based loss-of-excitation protection |
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| CHEN Xin_mei,LI Ya_ping,ZHAO Li_ping.Two testing ways to test the impedance characteristics of microprocessor based loss-of-excitation protection[J].Power System Protection and Control,2001,29(6):43-44,48. |
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| Authors: | CHEN Xin_mei LI Ya_ping ZHAO Li_ping |
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| Abstract: | The basic principle of the microprocessor based loss-of-excitation protection is introduced in this paper and two testing ways to test the impedance characteristics of the protection are presented. The testing shows they are available and practical. |
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| Keywords: | loss-of-excitation protection static-stable impedance stable asynchronous impedance |
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