| 一种应用加权相容图的可测性寄存器分配算法 |
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| 引用本文： | 孙强,马光胜,刘晓晓,李海军. 一种应用加权相容图的可测性寄存器分配算法[J]. 小型微型计算机系统, 2008, 29(5): 989-992 |
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| 作者姓名： | 孙强 马光胜 刘晓晓 李海军 |
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| 作者单位： | 哈尔滨工程大学,计算机科学与技术学院,黑龙江,哈尔滨,150001 |
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| 摘 要： | 提出一种基于加权相容图的可测性寄存器分配模型,给出一个基于可测寄存器分配准则的相容图边的权值公式,并运用改进的加权团划分算法对加权相容图进行处理,从而实现了在寄存器分配过程中同时考虑4个可测性准则,达到提高设计可测性的目的.实验结果表明了算法在可测性方面的有效性.
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| 关 键 词： | 高层次综合 寄存器分配 可测性 加权相容图 加权团划分算法 应用 加权 相容图 可测性 寄存器分配算法 Graph Compatibility Weighted Used Testability Algorithm Allocation 有效性 结果 实验 高设计 分配准则 分配过程 处理 团划分算法 |
| 文章编号： | 1000-1220(2008)05-0989-04 |
| 修稿时间： | 2006-12-30 |
Register Allocation Algorithm for Testability Used Weighted Compatibility Graph |
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| SUN Qiang,MA Guang-sheng,LIU Xiao-xiao,LI Hai-jun. Register Allocation Algorithm for Testability Used Weighted Compatibility Graph[J]. Mini-micro Systems, 2008, 29(5): 989-992 |
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| Authors: | SUN Qiang MA Guang-sheng LIU Xiao-xiao LI Hai-jun |
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| Affiliation: | SUN Qiang,MA Guang-sheng,LIU Xiao-xiao,LI Hai-jun (Department of Computer Science , Technology,Harbin Engineering University,Harbin 150001,China) |
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| Abstract: | A novel model,weighted compatibility graph(WBCG)is proposed for solving register allocation for testability problem.A weighted formula of compatibility graph based on register allocation for testability is presented.An improved weighted-based clique partition algorithm is used to deal with this weighted compatibility graph.Thereby,four rules for testability are considered simultaneous in the course of register allocation and achieved the objective of high design for testability.Finally,experimental results ... |
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| Keywords: | high-level synthesis register allocation testability weighted compatibility graph clique partition algorithm |
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