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Single event burnout in power diodes: Mechanisms and models |
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| Authors: | A.M. Albadri R.D. Schrimpf K.F. Galloway D.G. Walker |
| Affiliation: | aDepartment of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN 37235, United States;bDepartment of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, United States |
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