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Reliability analysis of k-out-of-n systems with partially repairable multi-state components
Authors:Hoang Pham  A. Suprasad  R.B. Misra
Affiliation:Department of Industrial Engineering, College of Engineering, Rutgers University, PO Box 909, Piscataway, NJ 08855-0909, U.S.A.;Indian Institute of Technology, Kharagpur, India
Abstract:In some environments the components might not fail fully, but can lead to degradation and the efficiency of the system may decreases. However, the degraded components can be restored back through a proper repair mechanism. In this paper, we present a model to perform reliability analysis of k-out-of-n systems assuming that components are subjected to three states such as good, degraded, and catastrophic failure. We also present expressions for reliability and mean time to failure (MTTF) of k-out-of-n systems. Simple reliability and MTTF expressions for the triple-modular redundant (TMR) system, and numerical examples are also presented in this study.
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