| X射线TICT中射束硬化拟合校正研究 |
| |
| 引用本文： | 彭光含,杨学恒,韩忠,周日峰,蔡新华,乔闹生.X射线TICT中射束硬化拟合校正研究[J].光电工程,2006,33(11):137-141. |
| |
| 作者姓名： | 彭光含 杨学恒 韩忠 周日峰 蔡新华 乔闹生 |
| |
| 作者单位： | 湖南文理学院,物电系,湖南,常德,415000;重庆大学,自动化学院,重庆,400030;重庆大学,数理学院,重庆,400030;重庆大学ICT中心,重庆,400030;湖南文理学院,物电系,湖南,常德,415000 |
| |
| 基金项目： | 科技部火炬计划;湖南省教育厅科研项目;南文理学院资助项目 |
| |
| 摘 要： | X射线TICT中,由于射线硬化现象使图像重建时出现伪影。文中对X射线硬化现象进行了分析,探讨了在均匀物质中,X射线射束和与透射厚度的关系,并根据Beer定律和X射线与物质作用的特点,通过获取X射线射束和数据,首先拟合出射束和与透射厚度的关系式,然后得出X射线射束和校正为单色射线射束和的等效厚度与透射厚度的关系及其等效方法,最终得出X射线等效单色射线的衰减系数的拟合值,再对此衰减系数拟合值进行卷积反投影重构,即可有效消除X射线射束硬化的影响。
|
| 关 键 词： | X射线 计算机断层扫描成像技术 射束硬化 拟合校正 射束和 |
| 文章编号： | 1003-501X(2006)11-0137-05 |
| 收稿时间： | 2006-02-25 |
| 修稿时间： | 2006-06-19 |
Beam hardening fitting correction method for X-ray TICT |
| |
| PENG Guang-han,YANG Xue-heng,HAN Zhong,ZHOU Ri-feng,CAI Xin-hua,QIAO Nao-sheng.Beam hardening fitting correction method for X-ray TICT[J].Opto-Electronic Engineering,2006,33(11):137-141. |
| |
| Authors: | PENG Guang-han YANG Xue-heng HAN Zhong ZHOU Ri-feng CAI Xin-hua QIAO Nao-sheng |
| |
| Affiliation: | 1. Department ofPhy, andElectr, Hunan University of Arts andScience, Changde 415000, China; 2. College of Automation, Chongqing University, Chongqing 400030, China; 3. College of Science, Chongqing University, Chongqing 400030, China; 4. ICT Center, Chongqing University, Chongqing 400030, China |
| |
| Abstract: | The beam hardening will result in artifact as reconstruction image in X-ray (TICT). In the paper, we analyze the phenomenon of X-ray Beam hardening, and discuss the relation between the X-ray beam sum and the transmission thickness. Based on the law of Beer and the characteristics of X-ray internal material, the relation equation between beam sum and transmission thickness is simulated by getting the data of X-ray beam sum. Then, the relation and the equivalent method are carried out between the equivalent thickness and the transmission thickness for X-ray beam sum being corrected for monochromatic ray beam. At last, the attenuation coefficient simulated value for X-ray equivalent monochromatic is reasoned out, and then the attenuation coefficient fitting value is used for product back-projection reconstruction. As a result, the effect caused by X-ray beam hardening is eliminated effectively. |
| |
| Keywords: | X-ray TICT Beam hardening Fitting correction Beam sum |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
