| 用光学赝外差法探测相位变化 |
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| 引用本文： | 杨齐民,熊秉衡,张文碧,冯薇,吕晓旭.用光学赝外差法探测相位变化[J].云南工业大学学报,1993(2). |
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| 作者姓名： | 杨齐民 熊秉衡 张文碧 冯薇 吕晓旭 |
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| 作者单位： | 云南工学院激光研究所，云南工学院激光研究所，云南工学院激光研究所，云南工学院激光研究所，云南工学院激光研究所 |
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| 摘 要： | 本文报导光学赝外差方法,它是利用LN晶体放置在迈克尔逊干涉仪的参考臂中做电光相位调制。在光电接收后,利用狭带放大器对光电信号的基频进行放大,把放大后的基频电信号与原调制电信号进行相位比较,来探测相位变化。我们利用此装置测量了PZT微位移器的工作曲线,得到了满意的结果。本文还介绍了赝外差方法在其它方面的应用。
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| 关 键 词： | 光学赝外差方法 电光相位调制 狭带滤波器 信噪比 相位比较 |
Phase Measuring by Optical False Heterodyne Method |
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| Authors: | Yang Qimin Xiong Binghen Zhang Wenbi Fong Wei Lu Xiaoxu |
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| Affiliation: | Laser Research Institute |
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| Abstract: | This paper present optical false heterodyne method.It's modulator of phase is constructed by LN crystal in Michelson's interferometer.By receiving photoelectrical interference signal,amplifying its fundamental frequency with narrow-band amplifier, and comparing the phase of the amplified signal with that of the original modulating signal,the changes of the phase could be measured. With this device,the characteristics of PZT micromovementer were measured.The experimental result was satisfactory.Other applications of optical false heterodyne method are also discussed in this paper. |
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