Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy |
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Authors: | Gaillard Cedric Stadelmann Pierre A Plummer Christopher J G Fuchs Gilbert |
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Affiliation: | Centre Interdisciplinaire de Microscopie Electronique, Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland. cedric.gaillard@epfl.ch |
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Abstract: | Morphologic characterization of polymers by scanning electron microscopy (SEM) is often made difficult by their sensitivity to electron beam damage. We describe here a specimen preparation method for the imaging of polymer blends by low-voltage SEM (LV-SEM) that improves their stability in the electron beam and hence facilitates focusing and recording of high magnification images. Its application to nanosized core-shell latexes embedded in a polymethylmethacrylate matrix and semi-crystalline polypropylene/ethylene-propylene rubber blends is discussed. |
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Keywords: | low‐voltage scanning electron microscopy ultramicrotomy polymer thin films core‐shell latexes |
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