Reliability models of a class of self-healing rings |
| |
Authors: | John Lee |
| |
Affiliation: | Nanjing Institute of Posts and Telecommunications, PO Box 83, Nanjing 21003, People's Republic of China |
| |
Abstract: | SDH/SONET technology provides the economical and convenient deployment of fault-tolerant high-speed telecommunication networks. This paper analyses a class of SDH/SONET self-healing rings (SHR), i.e. bi-directional SHRs (with two and four fibres) and uni-directional SHRs (including line-switched USHRs and path-switched USHRs). We derived, for both the two-terminal and the all-terminal, reliability models of the above mentioned SHR architectures. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|