Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces |
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| Affiliation: | 1. Mechanical Engineering, Colorado School of Mines, Golden, CO 80401, USA;2. Mechanical Engineering, Northwestern University, Evanston, IL 60208, USA;3. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA;4. Confluent Medical Technologies, Fremont, CA 94539, USA;1. National Engineering Research Center of Light Alloy Net Forming and State Key Laboratory of Metal Matrix Composite, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, PR China;2. College of Materials Science and Engineering, Chongqing University, Chongqing, 400044, PR China;3. Shanghai Innovation Institute for Materials, Shanghai, 200444, PR China |
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| Abstract: | An explicit solution is obtained for a general two-dimensional deformation matrix between two phases containing any combination of expansion/contraction and/or shear. Application of the solution to various cases of deformation shows that in the presence of a shear, an invariant line can be obtained even when the deformations along orthogonal directions are both contractions or expansions. Utilization of the solution in the design of thin-film overgrowths on substrates and the relationship between the solution eigenvectors in real and reciprocal space are discussed. |
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