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基于相移电子莫尔条纹的深度非球面检测
引用本文:程仕东,张学军,张忠玉,张峰. 基于相移电子莫尔条纹的深度非球面检测[J]. 光学精密工程, 2003, 11(3): 250-255
作者姓名:程仕东  张学军  张忠玉  张峰
作者单位:1. 中国科学院长春光学精密机械与物理研究所,吉林,长春,130022
2. 吉林大学原子分子研究所,吉林,长春,130022
基金项目:PartsoftheworkpresentedherearesupportedbyNSFC'sfundingfordistinguishedyoungscholars(No .6 992 5 5 12),andCAD’sfundingforinnovationsinsciencesandtechnologies
摘    要:通过相移技术检测深度非球面波前时,CCD相机和计算机分辨率受到Nyguist频率的限制.基于相互平行相移莫尔条纹干涉技术,我们提出一种新颖有效的检测技术.相互平行的相移电子莫尔条纹是由计算机产生三幅光栅作为参考波前,分别和输入被检干涉图相叠加,并通过低通滤波器滤波滤掉高频而得到的.最后,由三步相移算法,我们得出非球面的面形分布.

关 键 词:条纹分析  莫尔条纹  补偿检验
收稿时间:2002-12-10
修稿时间:2003-03-16

Deep aspheric testing based on phase-shift electronic Moiré patterns
Abstract. Deep aspheric testing based on phase-shift electronic Moiré patterns[J]. Optics and Precision Engineering, 2003, 11(3): 250-255
Authors:Abstract
Affiliation:1.Changchun Institute of Optics, Fine Mechanics &; Physics, Changchun 130022, China;2. Atomic Molecule Institute, Jilin University, Changchun 130022, China
Abstract:The resolutions of CCD camera and digital computer are limited by Nyquist frequency when deep aspheric wavefronts are tested using phase shifting technique. A new powerful technique based on parallel generations of three phase shift patterns through electronic multiplication with computer generated graftings and low pass filtering, is proposed for measuring wavefronts with large departures from a reference sphere such as those encountered during testing of steep aspheric surfaces. The phase distribution of aspheric surfaces is obtained using a three step phase shifting algorithm.
Keywords:fringe analysis  moire patterns  compensating testing
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