Reliability of Active-Matrix Organic Light-Emitting-Diode Arrays With Amorphous Silicon Thin-Film Transistor Backplanes on Clear Plastic |
| |
Authors: | Hekmatshoar B. Kattamis A.Z. Cherenack K.H. Ke Long Jian-Zhang Chen Wagner S. Sturm J.C. Rajan K. Hack M. |
| |
Affiliation: | Princeton Univ., Princeton; |
| |
Abstract: | We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 degC using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of the light emission over time. |
| |
Keywords: | |
|