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| 多种材料软X光平面镜反射率标定 | |
| 引用本文： | 孙可煦,崔延莉,易荣清,江少恩,黄天恒,杨家敏,丁永坤,崔明启,朱佩平,赵屹东,黎刚,张景和.多种材料软X光平面镜反射率标定[J].光学精密工程,2003,11(4):349-353. |
| 作者姓名： | 孙可煦 崔延莉 易荣清 江少恩 黄天恒 杨家敏 丁永坤 崔明启 朱佩平 赵屹东 黎刚 张景和 |
| 作者单位： | 1. 中国工程物理研究院,激光聚变研究中心高温高密度等离子体物理国家重点实验室,四川,绵阳,621900 2. 中国科学院,高能物理研究所,同步辐射实验室,北京,100039 3. 哈尔滨工业大学,精密工程研究所,黑龙江,哈尔滨,150001 |
| 基金项目： | 国家高技术863 416 3资助项目 |
| 摘 要： | 利用北京同步辐射装置(BSRF) 3W1B束线及反射率计靶室,在束流强度40～120mA、贮存环电子能量2GeV专用光运行模式下,做了不同材料掠入射平面镜反射率标定实验。标定过程用高灵敏度无死层的硅光二极管代替X射线二极管(XRD)作探测器,使输出信号提高2～3个量级,可标定能区从150～270eV拓展为50～1500eV能区,对C,Si和Ni材料平面镜给出完整的反射率标定曲线,最终把实验数据与理论计算比对并分析。 |
| 关 键 词： | 同步辐射 平面镜 反射率 标定 |
| 文章编号： | 1004-924X(2003)04-0349-05 |
| 收稿时间： | 2003/1/20 |
| 修稿时间： | 2003年1月20日 |
Reflectance calibration of different material soft X-ray planar mirrors by BSRF |
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| SUN Ke-xu,CUI Yan-li,YI Rong-qing,JIANG Shao-en,HUANG Tian-xuan,YANG Jia-min,DING Yong-kun,CUI Ming-qi,ZHU Pei-ping,ZHAO Yi-dong,LI Gang,ZHANG Jing-he.Reflectance calibration of different material soft X-ray planar mirrors by BSRF[J].Optics and Precision Engineering,2003,11(4):349-353. | |
| Authors: | SUN Ke-xu CUI Yan-li YI Rong-qing JIANG Shao-en HUANG Tian-xuan YANG Jia-min DING Yong-kun CUI Ming-qi ZHU Pei-ping ZHAO Yi-dong LI Gang ZHANG Jing-he |
| Affiliation: | 1. National Key Laboratory of Laser Fusion, Laser Fusion Research Center China Academy of Engineeing Physics, Mianyang 621900, China;2. Synchrotron Radiation Laboratory of Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039, China;3. The Department of Fine Mechanical Engineering, Haerbin Institute of Technology, Haerbin 150001, China |
| Abstract: | Beijing synchrotron radiation facility(BSRF) 3W1B beam line with beam current of 40～120 mA, storage ring electron energy of 2 GeV and photon energy of 50～1 500 eV was used to conduct experiments on the reflectance calibration method. The XRD detectors of planar mirror facility were replaced by AXUV 100, increasing the rate of signal versus noise by 2 to 3 orders of magnitude, and the calibration region of 150～270 eV has been expanded to be 50～1 500 eV. The reflectivity calibration curves for 5℃, Si and Ni planar mirrors are given, and the values of experiment and calculation are compared and analyzed. |
| Keywords: | synchrotron radiation planar mirror reflectance calibration |
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