| CAF：电子工业小型化的威胁 |
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| 引用本文： | 高艳丽,华嘉桢. CAF：电子工业小型化的威胁[J]. 印制电路信息, 2005, 0(10): 56-59 |
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| 作者姓名： | 高艳丽 华嘉桢 |
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| 作者单位： | 江南计算技术研究所,214083 |
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| 摘 要： | 概述了CAF的历史、发生的原理,分析了CAF产生的根本原因,比较了几种CAF失效分析的方法,同时也介绍了一种简易的测试设备。
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| 关 键 词： | CAF 小型化 |
Conductive Anodic Filament (CAF): The Threat to Miniaturization of the Electronics Industry |
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| Gao Yanli,Hua Jiazhen. Conductive Anodic Filament (CAF): The Threat to Miniaturization of the Electronics Industry[J]. Printed Circuit Information, 2005, 0(10): 56-59 |
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| Authors: | Gao Yanli Hua Jiazhen |
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| Affiliation: | Gao Yanli Hua Jiazhen |
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| Abstract: | This paper summarizes the history of CAF and its theories, analyzing the root causes for CAF formationand comparing various methods of CAF failure analysis. A simple test vehicle is also shown to us. |
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| Keywords: | CAF miniaturization |
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