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Microstructure Characterization of the (1−x)La2/3TiO3·xLaAlO3 System
Authors:Hwack Joo Lee  Hyun Min Park  Yang Koo Cho  Sahn Nahm
Affiliation:New Materials Evaluation Center, Korea Research Institute of Standards and Science, Daeduk Science Town, Daejon, 305-340, Korea;Division of Materials and Metallurgical Engineering, Korea University, Seoul 136-701, Korea
Abstract:Microstructural characterizations on the (1? x )La2/3TiO3· x LaAlO3 (LTLA) system were conducted using transmission electron microscopy. The presence of La2Ti2O7 and La4Ti9O24 phases in pure La2/3TiO3 is confirmed by the electron diffraction pattern. When x = 0.1, the ordering due to the A-site vacancies could be confirmed by the presence of antiphase boundaries (APBs) and return ½(100) superlattice reflection. As x increases, the ordering decreases and finally disappears when x = 0.6. The tilting of oxygen octahedra could be demonstrated by the presence of the ferroelastic domains in the matrix and return ½(111) and return ½(110) superlattice reflections in selected area electron diffraction patterns. In pure LaAlO3, only the antiphase tilting of oxygen octahedra is present due to the presence of return ½(111) superlattice reflection. In the LTLA system of x = 0.1, both the antiphase and in-phase tiltings of the oxygen octahedra are involved; however, in the range of x from 0.3 to 0.9, the antiphase tilting of oxygen octahedra has appeared. The growth of the ferroelastic domains is influenced by the APBs in the matrix.
Keywords:microstructure  dielectric materials/properties  lanthanum/lanthanum compounds
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