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大容量IGBT可靠性的分析
引用本文:屈维谦,王久和.大容量IGBT可靠性的分析[J].电气开关,2008,46(4):1-4.
作者姓名:屈维谦  王久和
作者单位:1. 北京内达调速科技有限公司,北京,100080
2. 北京信息工程学院,北京,100101
摘    要:针对大功率IGBT在变频、斩波调速应用中实际出现的击穿、爆炸的现象,从IGBT的结构、定额、过载能力、管芯结构、模块结构与散热、驱动与隔离入手,结合对IGBT的解剖分析,对IGBT进行了可靠性分析。指出了影响IGBT可靠性的诸多因素,提出了提高IGBT可靠性的措施。

关 键 词:大容量IGBT  可靠性  标称电流  过载能力  管芯并联  驱动隔离

Analysis on Reliability of High Power IGBT
QU Wei-qian,WANG Jiu-he.Analysis on Reliability of High Power IGBT[J].Electric Switchgear,2008,46(4):1-4.
Authors:QU Wei-qian  WANG Jiu-he
Affiliation:QU Wei-qian , WANG Jiu-he (1. Beijing Neida Speed Regulation Co. Ltd. , Beijing 100080, China; 2. Beijing Information Technology Institute, Beijing 100101 ,China)
Abstract:From the texture,rated,overload ability,construction of transistor core,module composition and radiation,drive and separation,combined with dissection for IGBT,this paper analyzes the reliability of high power IGBT refer to puncture and explosion of high power IGBT in converter and chopping wave speed-regulation in practice.Meantime,the factors influencing the reliability and measures increasing the reliability of high power IGBT are pointed out.
Keywords:high power IGBT  reliability  rated current  overload ability  parallel of transistor core  drive and separation
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