Lifetime prediction model for electric vehicle IGBT modules under driving conditions |
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| Authors: | Ling-Ling Li Peng-Chong Wang |
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| Affiliation: | 1. State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin, China;2. Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China |
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| Abstract: | In order to study the effect of road conditions and electric vehicle (EV) running speed on useful lifespan, a model for predicting the lifespans of insulated gate bipolar transistor (IGBT) modules of EVs is proposed. The life cycle prediction model was formulated according to an analysis of the working state, power loss, and junction temperature fluctuation of IGBT modules under driving conditions and was implemented using MATLAB software. Then, the lifetime prediction model was used to calculate the life mileage of an EV under the New European Driving Cycle (NEDC); the results predict a life mileage of 182.98 km. The simulation results of junction temperatures under the NEDC conditions indicate that the acceleration process of EVs has a substantial influence on the lifetime of IGBT modules. The lifetime prediction model was also used to analyze the relationship between the speed of EVs and the lifetime of IGBT modules. The IGBT modules have a maximum life mileage at a constant speed of 70 km/h; life mileage declines gradually as the speed increases or decreases. This lifetime prediction model can be used to predict lifetime of EV IGBT modules under driving conditions and analyze the effect of driving conditions on lifespan effectively. |
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| Keywords: | Driving conditions electric vehicle IGBT lifetime prediction |
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