ZnO/Ag 纳米线复合薄膜的光电导型紫外探测器

ZnO/Ag纳米线复合薄膜紫外探测器是利用水热法在旋涂制备的Ag纳米线薄膜上生长ZnO 纳米线阵列制备得到。此紫外探测器在4.9 mW cm_-2紫外光强和1V偏压下,其明暗电流比为3100,响应恢复时间分别为3.47s和3.28s,响应度为0.25A/W,探测度为6.9×10₁₂Jones。制备和工作参数被分析以优化紫外探测器结构和性能,如ZnO 纳米线的生长时间,Ag纳米线薄膜的旋涂转速和紫外探测器的工作温度。

ZnO/Ag nanowires composite film ultraviolet photoconductive detector

ZnO/Ag nanowires (NWs) film ultraviolet (UV) detector was fabricated by a simple and low-cost solution-processed method. In order to prepare this device, Ag NWs network was first spin-coated on glass substrate as a transparent conducting electrode, then ZnO NWs arrays were grown vertically on the Ag NWs network based on the hydrothermal method. This UV detector exhibited an excellent detection performance with large on/off ratio and short response time. Several process and working parameters were particularly investigated to analyze the relationship between structure and performance, which include growth time of ZnO NWs array, spin speed of Ag NWs network and working temperature. This UV photoconductive detector is based on two kinds of one-dimension nanomaterials, and it was regarded as a compromise between high performance with large area, low voltage and low cost.