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Structural stability of Nd2Zr2O7 pyrochlore ion-irradiated in a broad energy range
Authors:G. Sattonnay  N. Sellami  L. Thomé  C. Legros  C. Grygiel  I. Monnet  J. Jagielski  I. Jozwik-Biala  P. Simon
Affiliation:1. Université Paris Sud, ICMMO-LEMHE, Bât. 410, F-91405 Orsay, France;2. CSNSM, CNRS, IN2P3, Université Paris-Sud, Bât. 108, F-91405 Orsay, France;3. CIMAP, CEA, CNRS, Université de Caen, BP 5133, F-14070 Caen Cedex 5, France;4. Institute for Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland;5. The Andrzej Soltan Institute for Nuclear Studies, 05-400 Swierk/Otwock, Poland;6. CNRS, UPR 3079, CEMHTI, 1D avenue de la Recherche Scientifique, F-45071 Orléans Cedex 2, France
Abstract:The phase transformations induced by electronic excitation (Se) and ballistic processes (Sn) in Nd2Zr2O7 pyrochlores irradiated with heavy ions in three domains of energy (~1 GeV, ~100 MeV and a few MeV) were investigated by X-ray diffraction, Raman spectroscopy and transmission electron microscopy. In the Se regime at high energy, results show that: (i) ion tracks are formed above a Se threshold of 12.5 keV nm?1; (ii) both pyrochlore  anion-deficient fluorite phase transition and amorphization occur; (iii) total amorphization is always observed at the highest fluences; (iv) the internal structure (amount of amorphous phase vs. its anion-deficient fluorite counterpart) and the diameter of tracks depend on many parameters such as Se, the deposited energy density and the recrystallization rate. For irradiations performed with low-energy ions in the Sn regime, only the anion-deficient fluorite phase is formed up to a dose of 40 dpa. Thus Nd2Zr2O7 exhibits an unusual behaviour since this compound is amorphizable by Se and non-amorphizable by Sn. Annealing of totally amorphized Nd2Zr2O7 samples reveals strong differences in the recovery processes with other pyrochlore materials that are related to their different chemical compositions.
Keywords:Ion irradiation  Pyrochlores  X-ray diffraction  High-resolution transmission electron microscopy  Raman spectroscopy
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